Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory
- 14 July 1995
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 2428, 469-478
- https://doi.org/10.1117/12.213727
Abstract
Our extensive measurements of damage thresholds for fused silica and several fluorides (LiF, CaF, MgF, and BaF) at 1053 and 526 nm for pulse durations, (tau) , ranging from 275 fs to 1 ns are reported elsewhere at this meeting. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with experimental results.Keywords
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