Abstract
An efficient modelling method to simulate Ti-indiffused LiNbO/sub 3/ channel waveguide devices from their design and fabrication parameters is discussed. Procedures are: (1) derivation of the two-dimensional (2-D) refractive index profile; (2) transformation of the 2-D transverse refractive index profile to its one-dimensional (1-D) effective index profile; and (3) use of the 2-D beam propagation method to analyze the device performance. With slight consistent adjustments on Ti-induced refractive index changes, it is possible to calculate the performance of directional couplers in good agreement with experimental measurements. This modeling method can be used to predict performance of future devices.