Electrical characterization of multilayered thin film integral passive devices
- 27 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 240-246
- https://doi.org/10.1109/ectc.1998.678700
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Process for the Manufacture of Cost Competitive MCM SubstratesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Embedded thin film resistors, capacitors and inductors in flexible polyimide filmsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- The "Stealth" decoupling capacitorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002