Improvement in accuracy of spectroscopic IR ellipsometry by the use of IR retarders
- 31 January 1984
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 24 (1) , 1-5
- https://doi.org/10.1016/0020-0891(84)90039-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Spectroscopic ellipsometry in the infraredInfrared Physics, 1981
- Graphical method to design multilayer phase retardersApplied Optics, 1981
- MgF_2–Ag tunable reflection retarderApplied Optics, 1980
- Design of film–substrate single-reflection retarders*Journal of the Optical Society of America, 1975
- Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*Journal of the Optical Society of America, 1975