Corrugation of Si surfaces and profiles of tip apexes
- 1 January 1990
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 8 (1) , 222-225
- https://doi.org/10.1116/1.577071
Abstract
Si(111) surfaces heated at 1300 °C show many steps and terraces exhibiting the (√3×√3) R 30°, c(4×2), (5×5), (7×7), and (9×9) reconstructed structures. A detailed study of the surface corrugation indicates that the observed maximum depth of the corner hole is 2.4 Å and the trace of a scanning tip is close to the profile of the [111]-oriented W tip with a single atom at the apex and the most desirable cone angle of ∼120°. Occasionally, anomalous, ordered structures appeared and were explained as the result of the scanning with two apex atoms 4.5 Å apart, the distance between the nearest surface atoms of the W(111) plane.Keywords
This publication has 0 references indexed in Scilit: