Study of interfaces by field-ion microscopy
- 1 May 1973
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 27 (5) , 1169-1173
- https://doi.org/10.1080/14786437308225824
Abstract
The usefulness of the field-ion microscope as a tool for studying the structure of interfaces is governed by the resolution, the contrast theories and the crystallographic accuracy of the technique. These factors are considered in turn and an attempt is made to indicate some of the advantages and disadvantages of the field-ion microscope in this area.Keywords
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