BEEM imaging and spectroscopy of buried structures in semiconductors

• 1 August 2001
• journal article
• Published by Elsevier in Physics Reports
• Vol. 349  (6) , 447-514
• https://doi.org/10.1016/s0370-1573(00)00119-8

Abstract

Keywords

• 72.10.FK
• 73.20.AT
• 73.23.AD
• 73.40.NS
• BALLISTIC TRANSPORT
• TUNNELING MICROSCOPY
• SEMICONDUCTOR HETEROSTRUCTURES