High resolution depth profiling of F, Ne and Na in materials
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3) , 165-170
- https://doi.org/10.1016/0167-5087(83)90974-2
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A simple, digitally controlled, automatic, hysteresis free, high precision energy scanning system for Van de Graaff type accelerators: Part I: Principle, results and applicationsNuclear Instruments and Methods in Physics Research, 1983
- Depth profiling of implanted neon with resonant nuclear reactionsJournal of Nuclear Materials, 1978
- Sodium surface concentration analysis on glass by 23Na(p,α)20Ne nuclear reactionJournal of Non-Crystalline Solids, 1977