Deuterium migration and trapping in uranium and uranium dioxide during D+ implantation
- 31 January 1980
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 88 (1) , 23-30
- https://doi.org/10.1016/0022-3115(80)90382-7
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Diffusion studies by means of nuclear reaction depth profilingNuclear Instruments and Methods, 1978
- Trapping of hydrogen isotopes in molybdenum and niobium predamaged by ion implantationJournal of Applied Physics, 1977
- Range profiles of 6–16-keV hydrogen ions implanted in metal oxidesJournal of Applied Physics, 1976
- Formation and use of oxide films to impede outgassing of metalsJournal of Nuclear Materials, 1974
- Depth distribution of energy deposition by ion bombardmentComputer Physics Communications, 1974
- Use of the D-D reaction to locate deuterium implanted in metalsNuclear Instruments and Methods, 1974
- Ionization, thermal, and flux dependences of implantation disorder in siliconRadiation Effects, 1971
- The diffusion and solubility of hydrogen in uranium dioxide single crystalsJournal of Nuclear Materials, 1971
- Use of the Nuclear Reaction O16(d, p)O17 to Study Oxygen Diffusion in Solids and its Application to ZirconiumJournal of Applied Physics, 1968
- Kinetic Studies of Hydroxyl Radicals in Shock Waves. II. Induction Times in the Hydrogen-Oxygen ReactionThe Journal of Chemical Physics, 1958