Homogeneous Intermediate Valence of Sm on Cu(001)

Abstract
Ordered overlayers of Sm on Cu(001) were studied by low-energy diffraction and x-ray photoelectron spectroscopy. The Sm valence varied linearly from 2 to 2.7 during the formation of the monolayer. We argue that the intermediate valence was homogeneous. The behavior is compared with that of Sm overlayers on Al(001).

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