Automatically generating test data from a Boolean specification
- 1 May 1994
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Software Engineering
- Vol. 20 (5) , 353-363
- https://doi.org/10.1109/32.286420
Abstract
This paper presents a family of strategies for automatically generating test data for any implementation intended to satisfy a given specification that is a Boolean formula. The fault detection effectiveness of these strategies is investigated both analytically and empirically, and the costs, assessed in terms of test set size, are compared.Keywords
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