Determination of the composition of GeSi alloy by ellipsometry
- 16 May 1979
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 53 (1) , 321-325
- https://doi.org/10.1002/pssa.2210530137
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On-time determination of the composition of III-V ternary layers during VPE growthApplied Physics Letters, 1978
- Lattice Parameter and Density in Germanium-Silicon Alloys1The Journal of Physical Chemistry, 1964
- Optical Measurement of Film Growth on Silicon and Germanium Surfaces in Room AirJournal of the Electrochemical Society, 1957