Energy dissipation during nanoscale indentation of polymers with an atomic force microscope
- 4 April 1994
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (14) , 1794-1796
- https://doi.org/10.1063/1.112003
Abstract
Nanometer size indentations on polypropylene and polymethylmethacrylate were made with the atomic force microscope and were 200-nm wide and 20-nm deep for a tip penetration depth of 75 nm. To image the indentations with the same tip used for writing, the tip was retracted at high speed, thus detaching any polymer sticking on it. Nanomechanical properties of polymer are studied in the limit of shallow indentations and slow penetration speed. From the hysteresis of the force versus tip motion curve, the dissipated energy during the indentation and the inelastic deformation of the polymer surface can be measured. We find that the measured dissipated energy is proportional to the volume of the indentation times the activation energy needed to excite chain segments motion during the deformation.Keywords
This publication has 8 references indexed in Scilit:
- X-ray photoelectron spectroscopy study of growth of thin cerium films on polypropyleneJournal of Vacuum Science & Technology A, 1993
- Submicrometer modification of polymer surfaces with a surface force microscopeApplied Physics Letters, 1992
- Machining Oxide Thin Films with an Atomic Force Microscope: Pattern and Object Formation on the Nanometer ScaleScience, 1992
- Manipulation of Adsorbed Atoms and Creation of New Structures on Room-Temperature Surfaces with a Scanning Tunneling MicroscopeScience, 1991
- Atomistic Mechanisms and Dynamics of Adhesion, Nanoindentation, and FractureScience, 1990
- Positioning single atoms with a scanning tunnelling microscopeNature, 1990
- Measuring the nanomechanical properties and surface forces of materials using an atomic force microscopeJournal of Vacuum Science & Technology A, 1989
- Hardness measurement at penetration depths as small as 20 nmPhilosophical Magazine A, 1983