Charging, long-term stability, and TSD measurements of SiO/sub 2/ electrets
- 1 June 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. 24 (3) , 439-442
- https://doi.org/10.1109/14.30886
Abstract
No abstract availableKeywords
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