Semiconductor and Gas-Ion-Chamber Detector System for the Mass Identification of 10- to 30-Mev Particles

Publisher Website
Google Scholar
Abstract
A charged‐particle detector system, which consists of a gas‐ion‐chamber ΔE counter and a semiconductor E counter, is described. The detector system has been employed in the study of nuclear reactions leading to protons, deuterons, tritons, He3, and alpha particles in the 10‐ to 30 Mev region, with mass and charge identification for each kind of detected particle. Although many particles have sufficient energy to penetrate beyond the sensitive depletion region of the semiconductor detector, the electronic selection system discriminates effectively against such particles. Those particles ending their range in the depletion region may be studied under conditions of energy resolution and mass discrimination much improved over the usual NaI scintillation detector system. Preliminary results of measurements with a lithium‐drifted p‐i‐n junction with a depletion region 2 mm thick are shown, and the advantages of using the thicker depletion region available with such devices with the same electronic system are demonstrated.

This publication has 5 references indexed in Scilit: