Quantitative analysis of trace and major elements in thin sections of soils with the secondary ion microscope (Cameca)
- 31 July 1983
- Vol. 30 (1-4) , 117-134
- https://doi.org/10.1016/0016-7061(83)90060-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Semiquantitative analyses by secondary ion mass spectrometry using one fitting parameterMicrochimica Acta, 1978
- Test of a quantitative approach to secondary ion mass spectrometry on glass and silicate standardsAnalytical Chemistry, 1977
- Theoretical and experimental aspects of secondary ion mass spectrometryVacuum, 1974
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973