New Electron Diffraction Techniques Using Electronic Hollow-Cone Illumination
- 1 March 1984
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 23 (3A) , L178
- https://doi.org/10.1143/jjap.23.l178
Abstract
Two electron diffraction techniques using electronic hollow-cone illumination have been developed to improve the convergent beam electron diffraction method. One of them gives clear whole patterns of the higher order Laue-zone lines without diffraction disks. This technique also allows taking any higher order Laue-zone patterns. The other gives twice as large a convergent angle as that of the conventional convergent beam electron diffraction method and allows the combined use of high resolution electron microscopy and convergent beam electron diffraction.Keywords
This publication has 3 references indexed in Scilit:
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- Comparison of hollow cone and axial bright field electron microscope imaging techniquesJournal of Microscopy, 1980
- A method for producing hollow cone illumination electronically in the conventional transmission microscopeUltramicroscopy, 1976