X-ray diffraction and x-ray absorption studies of porous silicon, siloxene, heat-treated siloxene, and layered polysilane
- 15 February 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 75 (4) , 1946-1951
- https://doi.org/10.1063/1.356342
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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