Defect-dependent Elasticity: Nanoindentation as a Probe of Stress State
- 1 August 2000
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 15 (8) , 1693-1701
- https://doi.org/10.1557/jmr.2000.0244
Abstract
Using an interfacial force microscope, the measured elastic response of 100-nm-thick Au films was found to be strongly correlated with the films' stress state and thermal history. Large, reversible variations (2×) of indentation modulus were recorded as a function of applied stress. Low-temperature annealing caused permanent changes in the films' measured elastic properties. The measured elastic response was also found to vary in close proximity to grain boundaries in thin films and near surface steps on single-crystal surfaces. These results demonstrate a complex interdependence of stress state, defect structure, and elastic properties in thin metallic films.Keywords
This publication has 27 references indexed in Scilit:
- Mechanical behavior of high-density nanocrystalline gold prepared by gas deposition methodActa Materialia, 1998
- Effect of Surface Steps on the Plastic Threshold in NanoindentationPhysical Review Letters, 1998
- Grain Size Dependence of Mechanical Properties in Nanocrystalline SeleniumJournal of Materials Research, 1997
- Influences of stress on the measurement of mechanical properties using nanoindentation: Part I. Experimental studies in an aluminum alloyJournal of Materials Research, 1996
- On the elastic moduli of nanocrystalline Fe, Cu, Ni, and Cu–Ni alloys prepared by mechanical milling/alloyingJournal of Materials Research, 1995
- Effect of porosity on Young's modulus of nanocrystalline materialsScripta Metallurgica et Materialia, 1993
- Grain size effects in nanocrystalline materialsJournal of Materials Research, 1992
- Grain boundaries as heterogeneous systems: atomic and continuum elastic propertiesPhilosophical Transactions A, 1992
- Mechanical behavior of nanocrystalline Cu and PdJournal of Materials Research, 1991
- A new force sensor incorporating force-feedback control for interfacial force microscopyReview of Scientific Instruments, 1991