Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction
- 22 February 2001
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 303 (1-2) , 150-157
- https://doi.org/10.1016/s0921-5093(00)01842-6
Abstract
No abstract availableKeywords
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