Thermal Fluctuation Aftereffect of Exchange Coupled Films for Spin Valve Devices
- 1 January 1998
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Magnetic thin films in recording technologyIBM Journal of Research and Development, 1990
- Temperature and frequency dependence of exchange anisotropy effects in oxidized NiFe filmsJournal of Applied Physics, 1972