High resolution depth profiling of oxide layers on magnesium and aluminium by the nuclear resonance broadening method
- 1 March 1985
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 69 (2) , 527-530
- https://doi.org/10.1016/0025-5416(85)90354-4
Abstract
No abstract availableKeywords
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