EXAFS and surface EXAFS from measurements of X-ray reflectivity
- 20 April 1980
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 13 (11) , L249-L253
- https://doi.org/10.1088/0022-3719/13/11/002
Abstract
Calculated X-ray reflectivity spectra near glancing incidence show extended fine structure. The authors show that such spectra are surface sensitive and may be used to determine structural parameters for both substrates and absorbed overlayers.Keywords
This publication has 15 references indexed in Scilit:
- Sexafs studies of iodine adsorbed on single crystal substratesSurface Science, 1979
- EXAFS study of the structure of amorphous and crystalline arsenic oxidePhilosophical Magazine Part B, 1979
- Extended X-Ray—Absorption Fine Structure of Small Cu and Ni Clusters: Binding-Energy and Bond-Length Changes with Cluster SizePhysical Review Letters, 1979
- EXAFS studies on Al-Cu alloysPhilosophical Magazine Part B, 1979
- X-ray photoabsorption of solids by specular reflectionJournal of Physics C: Solid State Physics, 1978
- Position and Dynamics of Ag Ions in Superionic AgI Using Extended X-Ray Absorption Fine StructurePhysical Review Letters, 1977
- Synchrotron radiations studies of x-ray absorption spectra of ions in aqueous solutionsChemical Physics Letters, 1975
- Theory of the extended x-ray absorption fine structurePhysical Review B, 1975
- Ultrasoft-X-Ray Reflection, Refraction, and Production of Photoelectrons (100-1000-eV Region)Physical Review A, 1972
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954