White-beam synchrotron topographic characterization of flux-grown KTiOAsO4
- 1 January 1996
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 68 (1) , 25-27
- https://doi.org/10.1063/1.116744
Abstract
KTiOAsO4 crystals grown from tungstate fluxes have been studied by white‐beam synchrotron radiation topography. It is shown that growth striations are primary planar defects. By anomalous scattering, ferroelectric domains in KTA are investigated and the ratio of ‖F(004)‖2 to ‖F(004̄)‖2 is calculated. The mechanisms of domain inversion via 2‐fold axis or n‐glide plane are also discussed in terms of the structural characteristics of KTA.Keywords
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