A New X-Ray Diffraction Method for Thin Film Thickness Estimation
- 16 July 1982
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 72 (1) , K95-K98
- https://doi.org/10.1002/pssa.2210720165
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- LAZY PULVERIX, a computer program, for calculating X-ray and neutron diffraction powder patternsJournal of Applied Crystallography, 1977