In situ spectroscopic ellipsometry of mercury cadmium telluride MBE layers
- 1 February 1987
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 81 (1-4) , 97-100
- https://doi.org/10.1016/0022-0248(87)90372-1
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfacesJournal of Applied Physics, 1986
- Molecular beam epitaxy of II–VI compounds: CdxHg1−xTeJournal of Crystal Growth, 1981
- Temperature Dependence ofE1 andE1 + Δ1 Maxima in the Fundamental Reflection for Cdx Hg1-xTe Solid SolutionsPhysica Status Solidi (b), 1975
- Precision Bounds to Ellipsometer SystemsApplied Optics, 1975