Leakage current and breakdown characteristics of P-N diodes
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Visible Light Emission and Microplasma Phenomena in Silicon p-n Junction II. Classification of weak spots in diffused p-n junctionsJournal of the Physics Society Japan, 1960
- Visible Light Emission and Microplasma Phenomena in Silicon p–n Junction, I.Journal of the Physics Society Japan, 1960