An Infant Mortality and Long-Term Failure Rate Model for Electronic Equipment

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Abstract
This paper describes the reliability model used by system designers at AT&T Bell Laboratories to predict component and equipment reliability. A decreasing-failure-rate Weibull model describes the high incidence of early-life failures, or infant mortality. This is combined with the constant-failure-rate (exponential) model traditionally and widely used for the long term. Formal modeling of both early-life and long-term reliability is needed to manage the development and manufacture of reliable products. The effects of temperature and electrical stress on failure rate are taken into account. A model for the effect of integrated circuit dynamic burn-in on reliability is also described.

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