A programmable 256K CMOS EPROM with on-chip test circuits

• 1 January 1984
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• Vol. XXVII, 148-149
• https://doi.org/10.1109/isscc.1984.1156605

Abstract

Keywords

• CIRCUIT TESTING
• EPROM
• VOLTAGE CONTROL
• ENERGY CONSUMPTION
• THRESHOLD VOLTAGE
• STRESS CONTROL
• CMOS TECHNOLOGY
• SEMICONDUCTOR DEVICES
• POWER ENGINEERING AND ENERGY
• LABORATORIES