Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device
- 24 June 2003
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 67 (6) , 062307
- https://doi.org/10.1103/physreva.67.062307
Abstract
We present the full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubit device by just replicating the whole experimental setup n times.Keywords
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This publication has 3 references indexed in Scilit:
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- Quantum Tomography for Measuring Experimentally the Matrix Elements of an Arbitrary Quantum OperationPhysical Review Letters, 2001
- Tomographic Measurement of Joint Photon Statistics of the Twin-Beam Quantum StatePhysical Review Letters, 2000