A novel interferometer for dimensional measurement of a silicon sphere
- 1 April 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 46 (2) , 563-565
- https://doi.org/10.1109/19.571915
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Absolute measurement of the density of silicon crystals in vacuo for a determination of the Avogadro constantIEEE Transactions on Instrumentation and Measurement, 1995
- Precise method of determining systematic errors in phase-shifting interferometry on Fizeau interferencesApplied Optics, 1993
- Absolute sphericity measurementApplied Optics, 1989
- Toward the Avogadro constant-preliminary results on the molar volume of siliconIEEE Transactions on Instrumentation and Measurement, 1989
- The results of a comparison between calculated and measured values of the refractive index of airJournal of Physics E: Scientific Instruments, 1988
- Ball and cylinder interferometerJournal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation, 1972