Abstract
The application of sine-wave contrast sensitivity as an image assessment tool is examined. The required sinusoidal targets are carefully specified and the construction method is briefly described. Problems associated with the measurements are discussed and an apparatus for the subjective testing of visual instruments is presented. The method is used to investigate the best correction of astigmatism and field curvature in a telescopic system.© (1981) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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