A stand-alone scanning force and friction microscope
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1498-1503
- https://doi.org/10.1016/0304-3991(92)90472-v
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Combined scanning force and friction microscopy of micaNanotechnology, 1990
- Nanomechanics of a Au–Ir contact using a bidirectional atomic force microscopeJournal of Vacuum Science & Technology A, 1990
- Atomic scale friction between the muscovite mica cleavage plane and a tungsten tipThe Journal of Chemical Physics, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Semiconductor topography in aqueous environments: Tunneling microscopy of chemomechanically polished (001) GaAsApplied Physics Letters, 1987