ESCA and FT‐IR studies on boundary‐phase structure between blend polymers and polyamide substrate

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Abstract
Electron spectroscopy for chemical analysis (ESCA) and Fourier‐transform infrared (FT‐IR) attenuated total reflection (ATR) studies have been made on the film of blend polymers consisting of poly(hydroxypropyl ether) of bisphenol A (P) and poly(ethylene oxide) (E) or P and poly(ethylene adipate) (A) formed on nylon‐6 (Ny) substrate to investigate the boundary‐phase structure between the substrate and the polymer blends. For the case of P/A blend, A is enriched to the depths probed by both ESCA (below ca. 60 Å) and FT‐IR‐ATR (below ca. 0.7 μm) from the nylon‐6 surface. For the P/E blend, though P is enriched to the depth probed by ESCA from the Ny surface, the enrichment of neither of the blend components can be found to the depth probed by FT‐IR‐ATR. These results indicate the different susceptibility between P/A and P/E blends to the influence from the Ny substrate.