Accumulation and Depletion Layer Thicknesses in Organic Field Effect Transistors
Open Access
- 1 December 2003
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 42 (Part 2, No) , L1408-L1410
- https://doi.org/10.1143/jjap.42.l1408
Abstract
We present a simple but powerful method to determine the thicknesses of the accumulation and depletion layers and the distribution curve of injected carriers in organic field effect transistors. The conductivity of organic semiconductors in thin film transistors was measured in-situ and continuously with a bottom contact configuration, as a function of film thickness at various gate voltages. Using this method, the thicknesses of the accumulation and depletion layers of pentacene were determined to be 0.9 nm (VG=-15 V) and 5 nm (VG=15 V).Keywords
All Related Versions
This publication has 0 references indexed in Scilit: