Polarization Dependence of the Piezoreflectance in Si and Ge
- 30 August 1965
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 15 (9) , 401-403
- https://doi.org/10.1103/physrevlett.15.401
Abstract
DOI: https://doi.org/10.1103/PhysRevLett.15.401Keywords
This publication has 13 references indexed in Scilit:
- Dependence of the Optical Constants of Silicon on Uniaxial StressPhysical Review Letters, 1965
- High-Sensitivity PiezoreflectivityPhysical Review Letters, 1965
- Electronic Spectra of Crystalline Germanium and SiliconPhysical Review B, 1964
- Piezoreflectance in SiPhysics Letters, 1964
- Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation PotentialsPhysical Review B, 1963
- Critical Points and Ultraviolet Reflectivity of SemiconductorsPhysical Review Letters, 1962
- Piezoreflectance in GePhysical Review B, 1962
- Transport and Deformation-Potential Theory for Many-Valley Semiconductors with Anisotropic ScatteringPhysical Review B, 1956
- Theory of the Electrical Properties of Germanium and SiliconPublished by Elsevier ,1955
- Deformation Potentials and Mobilities in Non-Polar CrystalsPhysical Review B, 1950