Investigation of Traps in γ-Irradiated Polyethylene by Photostimulated Detrapping Current Analysis

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Abstract
An investigation of trap centers in γ-irradiated polyethylene was conducted by the photostimulated detrapping current analysis. It was revealed that two kinds of trap centers were introduced into polyethylene by γ-irradiation; one was a fairly deep trap (>3 eV) observed in specimens irradiated in air or in vacuum, while the other was a rather shallow one observed only in the specimen irradiated in air. The origin of the deep trap was assigned to crosslinks in the interfacial region between the crystalline and amorphous parts. Released molecular motion in this region was found to result in the reduction of the trap depth. Consequently the deep trap was considered to be a kind of physical trap like a cavity trap. The shallow traps were found to have a close correlation with the oxidation of the specimen.

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