Structure and microstructure of La1xCaxMnO3δ thin films prepared by pulsed laser deposition

Abstract
La1xCaxMnO3δ (LCMO) thin films are grown by pulsed laser deposition on a (100) SrTiO3 substrate at temperatures between 530 and 890 °C. The magnetotransport properties show a high negative magnetoresistance and a shift of the maximum of the R(T) curve as a function of temperature. The Curie temperature changes with deposition temperature and film quality in the range of 100–220 K. The film quality is characterized by x-ray diffraction and transmission electron microscopy (TEM); film and target compositions were verified by atomic emission spectroscopy. The local structure of the film depends on the growth conditions and substrate temperature. TEM reveals a slight distortion of the film possibly leading to a breakdown of the symmetry from orthorhombic to monoclinic. At the highest growth temperatures, a well-defined interface is observed within the LCMO film, parallel to the substrate surface; this interface divides the film into two lamellae with a different microstructure. The one close to the substrate is perfectly coherent with the substrate, suggesting that it is strained as a result of the lattice parameter mismatch; the upper lamella shows a typical domain structure with unusual translation interfaces characterized by a displacement vector of the type 12[101]o and 12[101]o when referred to the orthorhombic lattice.