Structure and microstructure of thin films prepared by pulsed laser deposition
- 15 September 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 58 (12) , 8065-8074
- https://doi.org/10.1103/physrevb.58.8065
Abstract
(LCMO) thin films are grown by pulsed laser deposition on a (100) substrate at temperatures between 530 and 890 °C. The magnetotransport properties show a high negative magnetoresistance and a shift of the maximum of the curve as a function of temperature. The Curie temperature changes with deposition temperature and film quality in the range of 100–220 K. The film quality is characterized by x-ray diffraction and transmission electron microscopy (TEM); film and target compositions were verified by atomic emission spectroscopy. The local structure of the film depends on the growth conditions and substrate temperature. TEM reveals a slight distortion of the film possibly leading to a breakdown of the symmetry from orthorhombic to monoclinic. At the highest growth temperatures, a well-defined interface is observed within the LCMO film, parallel to the substrate surface; this interface divides the film into two lamellae with a different microstructure. The one close to the substrate is perfectly coherent with the substrate, suggesting that it is strained as a result of the lattice parameter mismatch; the upper lamella shows a typical domain structure with unusual translation interfaces characterized by a displacement vector of the type and when referred to the orthorhombic lattice.
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