Optical measurements of oxide films on silicon
- 1 June 1963
- journal article
- Published by Springer Nature in Czechoslovak Journal of Physics
- Vol. 13 (6) , 452-458
- https://doi.org/10.1007/bf01687615
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Optical Measurement of Film Growth on Silicon and Germanium Surfaces in Room AirJournal of the Electrochemical Society, 1957
- Vacuum Deposition of Thin FilmsJournal of the Electrochemical Society, 1957
- Some New Formulas for Determining the Optical Constants from Measurements on Reflected LightJournal of the Optical Society of America, 1955
- The Adsorption of Water Vapor on Germanium and Germanium DioxideThe Journal of Physical Chemistry, 1955