Assessment of different models for quantitative Auger analysis in applied surface studies
- 30 April 1983
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 15 (1-4) , 270-280
- https://doi.org/10.1016/0378-5963(83)90022-3
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Scanning Auger spectroscopy studies of the sulphidization of electric contactsSurface Technology, 1981
- Experimental study of matrix effects in quantitative auger analysis of binary metal alloysSurface and Interface Analysis, 1981
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980
- Oberflächenanreicherung Beim Zerstäuben mit Verschiedenen IonenenergienActa Physica Academiae Scientiarum Hungaricae, 1980
- Alloy sputteringSurface Science, 1980
- The influence of ion sputtering on the elemental analysis of solid surfacesThin Solid Films, 1979
- Matrix effects in quantitative auger analysis of dilute alloysSurface Science, 1979
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Sputtering—a review of some recent experimental and theoretical aspectsApplied Physics A, 1975
- General formalism for quantitative Auger analysisSurface Science, 1975