Surface analysis of organic materials with TOF-SIMS
- 31 March 1993
- journal article
- Published by Elsevier in Journal of Molecular Structure
- Vol. 292, 49-63
- https://doi.org/10.1016/0022-2860(93)80089-e
Abstract
No abstract availableThis publication has 38 references indexed in Scilit:
- Field ionization and field desorption mass spectrometry: past, present, and futureAnalytical Chemistry, 1989
- Laserdesorptions‐Massenspektrometrie von Proteinen mit Molmassen zwischen 100000 und 250000 DaltonAngewandte Chemie, 1989
- Pyrolysis-field ionization mass spectrometry of aliphatic polyesters and their thermal interactions in mixturesJournal of Analytical and Applied Pyrolysis, 1989
- Plasma desorption mass spectrometry: coming of ageAnalytical Chemistry, 1988
- Mass spectrometryAnalytical Chemistry, 1988
- Fast-atom-bombardment mass spectrometry identification of oligomers contained in polysulfides and their complexes with heavy metalsMacromolecules, 1988
- Application of field desorption mass spectrometry to polymer and oligomer analysisProgress in Organic Coatings, 1988
- Identification of the ions produced by fast atom bombardment mass spectrometry in some polyesters and polyamidesAnalytical Chemistry, 1987
- Applications of mass spectrometry to polymersMass Spectrometry Reviews, 1984
- Fast atom bombardment mass spectrometry of polyglycolsInternational Journal of Mass Spectrometry and Ion Processes, 1984