An automatic visual inspection system for integrated circuit chips

This publication has 11 references indexed in Scilit:

• Analysis of a steepest-descent image-matching algorithm
  Pattern Recognition, 1978
• Pattern Recognition and Image Processing
  IEEE Transactions on Computers, 1976
• Recognizing patterns: Are there processes that precede feature analysis?
  Pattern Recognition, 1975
• Image filtering-A context dependent process
  IEEE Transactions on Circuits and Systems, 1975
• Automated Inspection of Electronic Assemblies
  Computer, 1975
• Grammatical Inference: Introduction and Survey - Part I
  IEEE Transactions on Systems, Man, and Cybernetics, 1975
• Correlation Techniques of Image Registration
  IEEE Transactions on Aerospace and Electronic Systems, 1974
• A process for detecting defects in complicated patterns
  Computer Graphics and Image Processing, 1973
• A Class of Algorithms for Fast Digital Image Registration
  IEEE Transactions on Computers, 1972
• Spatial Registration of Multispectral and Multitemporal Digital Imagery Using Fast Fourier Transform Techniques
  IEEE Transactions on Geoscience Electronics, 1970