Temperature and Stress Dependence of Electron Lifetime in-Type Semiconductors Between 1.5 and 4.2°K
- 7 November 1966
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 17 (19) , 1007-1009
- https://doi.org/10.1103/physrevlett.17.1007
Abstract
DOI: https://doi.org/10.1103/PhysRevLett.17.1007Keywords
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