A graphic technique for the determination of line-shape parameters using a reflection echelon
- 1 October 1968
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 1 (10) , 1353-1356
- https://doi.org/10.1088/0022-3727/1/10/315
Abstract
An analytical expression for the intensity distribution of a reflection echelon for a Doppler-broadened Lorentzian profile (Voigt profile) has been obtained. The results of calculations have been presented in a graphic form which can be used to determine both the parameters characteristic of a line shape.Keywords
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