X-ray structural characterization of larger CdSe semiconductor clusters

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Abstract
X‐ray powder patterns obtained from three different types of 35–40 Å CdSe nanoclusters are analyzed. We simulate the effects of thermal fluctuations, stacking faults, surface reconstructions, and bond compressions on powder patterns of CdSe clusters using the Debye formula. We find that the spectra of capped and annealed CdSe particles grown in inverse micelles are best fit by a mixture of crystalline structures intermediate between zinc‐blende and wurtzite. We describe a new preparation for CdSe clusters, the structure of which appears to be well‐defined wurtzite with, on average, less than one stacking fault per cluster. Thermal effects are found to be important and to mask the subtle effects of likely surface and core reconstructions.