GaAs MMICs: Manufacturing Trends and Issues
- 1 October 1984
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
The critical issues impacting the manufacturability of GaAs monolithic microwave integrated circuits are reviewed. The manufacturing problems encompass those of material quality, processing, and circuit design. In reality, these problems are closely related. Good substrates are a necessity for a reproducible process. The success of a particular circuit design approach is very much dependent on the limitations imposed by materials, processing capability and chip architecture. The manufacturing technology for fabricating GaAs monolithic microwave integrated circuits has improved over the past two years. The refinements now being made are directed primarily at enhancement of yield, realization of performance, and increase in circuit complexity. The purpose of this review paper is to (1) address the issues affecting the manufacture of GaAs MMICs and (2) present the industrial status (through an industrial data base) in addressing such issues as yield, throughput, design rules, chip architecture, reliability, design for yield and manufacturability, substrate qualification, choice of processing technology and current status of process related models and sensitivity analysis.Keywords
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