The growth and the X-ray diffraction spectra of the Pb/Ag superlattice

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Abstract
Layered Pb/Ag thin films have been produced by vacuum evaporation on cooled glass substrates. Measured X-ray diffraction spectra showed the peaks characteristic of a superlattice. A new model of a non-ideal superlattice is proposed in which thin layered films are composed of a large number of texturised grains. Calculated X-ray diffraction spectra are compared with experimental data. The agreement between the experimental data and the results of the calculates supports the model of layered growth of silver and lead within the grain. The influence of room-temperature annealing was observed.