Correlation between magnetic and structural properties of Ni/sub 80/Fe/sub 20/ sputtered thin films deposited on Cr and Ta buffer layers
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 30 (6) , 4878-4880
- https://doi.org/10.1109/20.334252
Abstract
No abstract availableKeywords
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