Electric breakdown through spherulites and along their boundaries in polyethylene thin films
- 1 March 1989
- journal article
- research article
- Published by Wiley in Electrical Engineering in Japan
- Vol. 109 (2) , 42-51
- https://doi.org/10.1002/eej.4391090206
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Electric Breakdown of Solution-Grown Polyethylene Films without SpheruliteJapanese Journal of Applied Physics, 1982
- Self-Healing Breakdown at Spherulite Boundaries of Polyethylene Thin FilmsJapanese Journal of Applied Physics, 1981
- The Influence of Morphology on the Electric Strength of Polymer InsulationIEEE Transactions on Electrical Insulation, 1980
- Dielectric Properties and Morphology in PolyethyleneIEEE Transactions on Electrical Insulation, 1980
- Observation of Dielectric Breakdown Sites in Polyethylene Thin FilmJapanese Journal of Applied Physics, 1980
- Conditions for complete self-healing breakdown in glow discharge polymerized styrene filmsThin Solid Films, 1979
- Temperature Dependence of Dielectric Breakdown of Hexatriacontane (C36H74) Single CrystalJapanese Journal of Applied Physics, 1979
- The maximum dielectric strength of thin silicon oxide filmsIEEE Transactions on Electron Devices, 1966