Production Statistics of SC (or TTC) Crystals

• 1 January 1980
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 167-174
• https://doi.org/10.1109/freq.1980.200398

Abstract

Keywords

• PRODUCTION
• STATISTICS
• CRYSTALS
• ELECTRICAL RESISTANCE MEASUREMENT
• CIRCUIT TESTING
• FREQUENCY
• AUTOMATIC TESTING
• SYSTEM TESTING
• TEMPERATURE
• OSCILLATORS